Directed Electronics 554A Provozní pokyny stáhnout pdf (Strana 15)

TM 11-6625-2611-12

2-10. Additional Test Capabilities

a. AOC reaction time

In addition to performing the measurements listed in

b. Internal suppression-ISLS

paragraph 2-9, the test set can be used in a number of

c. Preselector alignment

test setup configurations to test other transponder

d. Echo suppression

capabilities which include, but are not limited to, the

e. ISLS gate characteristics

following

f. ISLS rate limit

Section IV. CIRCUIT ALIGNMENT

2-11. Introduction

This section contains the operator’s checklist to deter-

mine the operational status of the test set. Refer to ta-

ble 2-4 for the checklist.

2-12. General Information

a. Use of Table. The operator’s checklist is a step-

by-step test procedure and should be performed in the

order given. The Control settings column specifies the

settings of the equipment to be changed for the specific

measurement. The Test procedure column refers to the

applicable test setup and provides specific parameters

to be measured. The Performance standard column

specifies the results that should be observed. In all

steps, except steps 1 and 2, if the results specified are

not obtained, higher category maintenance is required.

If the results specified for steps 1 and 2 are not ob-

tained, refer to troubleshooting procedures in chapter

4. Waveforms are shown in figure 4-1.

b. Additional Equipment Required. The oscilloscope

is required to perform the operator’s checklist

procedures.

c. Oscilloscope Preparation for Use. To prepare the

oscilloscope for use, connect the power lead to 115 vac

power source. Make a connection between ground on

the oscilloscope and GND on the test set. Position con-

trols as indicated in table 2-2.

d. Test Set Preparation for Use. To prepare the test

set for use, connect the power lead to 115 vac power

source. Connect the oscilloscope to the test set as shown

in figure 2-3. Set the remaining test set controls as

shown in table 2-3.

2-5

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